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標題: IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture [打印本頁]

作者: michaldl    時間: 2009-5-15 04:04 PM
標題: IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture
Sponsor5 y3 I$ d' a+ _, `
Test Technology Standards Committee of the IEEE Computer Society' t+ }5 i3 s, a" f
Approved 14 June 2001- [7 e" f3 z1 ]* q' s
IEEE-SA Standards Board7 M! T4 n$ \2 _  f5 `$ K% x
Abstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and# e- s, ?2 c- O. `' I* \- C4 t
support of assembled printed circuit boards is defined. The circuitry includes a standard interface, [) `6 h3 p- r. v( c/ m
through which instructions and test data are communicated. A set of test features is defined,- e: o* q9 O: [: {' u8 _
including a boundary-scan register, such that the component is able to respond to a minimum set4 _" v+ G3 d3 _- l" J. E
of instructions designed to assist with testing of assembled printed circuit boards. Also, a language* D! @9 [. C8 E' R
is defined that allows rigorous description of the component-specific aspects of such testability features.
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  g& X: K5 T: u8 }( EKeywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,' p* o& n5 D) |' ^; ^+ n7 V
boundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
0 @# O2 k! e( `; G7 i9 UTAP, test, test access port, VHDL, VHSIC Hardware Description Language% ~0 ?! `' O6 ^: x' k

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作者: madsilly    時間: 2009-9-4 03:00 PM
目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture# `# s+ U6 ?# x& i: P/ b! @
支持一下啦  謝分享
作者: madsilly    時間: 2009-9-4 03:07 PM
目前正在Study JTAG電路部分 對小弟應該頗有幫助 感恩啦
作者: leowang    時間: 2011-1-20 02:26 PM
目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture4 g: G. v2 q# a3 t2 p, H: m' \
感謝樓主分享
作者: sslin    時間: 2011-7-12 11:15 AM
目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture
  p* s5 _" s; j6 B& Q2 f, A, f1 R) D% F支持一下啦  謝分享
作者: wpwang    時間: 2011-7-19 03:04 PM
目前正需要IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture6 e; c- N" I6 X6 J$ m
  R' A, |1 L) @- R( ]支持一下啦  謝分享
作者: pauls    時間: 2012-5-30 01:09 PM
這東西~~現在極迫需要~~希望內容清晰~~多謝大大的分享~~~




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