Chip123 科技應用創新平台

標題: 9/16 2011 無線終端產品量測技術研討會 [打印本頁]

作者: mister_liu 時間: 2011-8-31 12:15 PM
標題: 9/16 2011 無線終端產品量測技術研討會
－無線終端產品測試:SAR、OTA、4G、HAC & EMI/ESD

為探討全球性通信資訊市場發展趨勢，使業界先進對電磁量測儀表(DASY, iSAR, OTA等)更廣泛瞭解，並熟悉相關配套量測工具之實際操作情形，及介紹新一代行動無線寬頻技術。耀豋科技秉持服務客戶精神，於2011年首度舉辦「無線終端產品量測技術研討會」，於會中分享CTIA最新法規與發展、SAR, HAC, LTE, NFC測量技術及最新測試功能，誠摯邀請您與我們共襄盛舉！

主辦單位：Schmid & Partner Engineering AG, Aplustech AT4 wireless, Auden Techno. Corp. 耀登科技股份有限公司
【會議地點及時間】：
Date： 16.September.2011 (Friday)
Time： 9:00 AM ~ 17:30 PM
Location：Grand Victoria Hotel- 168 Jing Ye 4th Rd, Taipei 104 TEL

02)8502-0000
Contact information: Auden Techno. Corp. Equipment Marketing Dept.
   TEL: (03) 3631901 or E-mail Ins@auden.com.tw
   Ext: 134 Stella  E-mail: Stella.huang@auden.com.tw
活動費用: 全程免費(提供午餐餐盒、講義、茶點、水果)

作者: mister_liu 時間: 2011-8-31 12:15 PM

Time	16. September. 2011 (Friday)-Taiwan		Speaker
9:00-9:30	Registration & Coffee
9:30-9:40	Opening		Daniel Chang
9:40-10:00	Topic SAR-1	Current status and future direction of SAR & HAC measurement standards:0 T* w4 `. H ]/ }/ l6 }- V Specific Absorption Rate (SAR): IEC 62209-x, IEEE 1528-x, IEC 62232	Dr. Mark Douglas
10:00-10:30	Topic SAR-2	The present SAR regulation & newest information in Japan	Dr. Nobuhiro Nakanishi
10:30-10:50	Coffee Break
10:50:11:20	Topic SAR-3	TAF Proficiency Test Requirement, take SAR for example.	Roger Sheng
11:20-11:40	Topic SAR-4	Meeting regulatory requirements for SAR measurements of wireless devices incl. hand phantoms, lap phantom and whole-body phantoms, base-station phantoms	Prof. Niels Kuster
11:40-12:00	Topic SAR-5	New advances in fast, reliable SAR measurement techniques	Dr. Mark Douglas
12:00-12:20	Topic SAR-6	Obtaining high-precision dielectric material characterization of liquids and solids	Dr. Mark Douglas
12:20-13:30	Lunch & DAK Demo
13:30-13:45	Topic OTA-1	Current status and future direction of CTIA 3.1 & 3GPP	Prof. Niels Kuster
13:45-14:25	Topic OTA-2	PART I - CTIA OTA TEST SYSTEM# \3 V' B, ?' u) \8 c1 I PART II - APLUSTECH PRODUCT & I: ^. w9 S4 }9 `+ Y2 @% ~# hPART III - MIMO ANTENNA TEST	Kyung-ki Min
14:25-14:40	Topic OTA-3	Novel OTA Phantoms	Prof. Niels Kuster
14:40-15:10	Topic 4G-1	NFC Testing Challenges ! U- i7 N) j( s1 V5 [7 x6 o3 h5 r* z7 e-. { ]9 r* P1 N& y) C NFC Technology Main Features% e4 A! ~+ o$ p- y7 ~ -& f8 \|* N" c- k$ E. M' G/ s8 }" ` NFC Testing Challenges 8 f! z& b4 \|7 S% ~7 ~' i- ! Y2 h2 O6 h L! [) d1 {NFC Forum Compliance Activities. b# ]. t3 o, Z -) V! e- A) t# ?' m9 G RIDER RFID HF Tester	Rafael Garcia Escobar
15:10-15:30	Coffee Break
15:30-16:00	Topic 4G-2	LTE R&D Testing 2 t6 X2 h4 P H( O4 C" Y- # n$ q5 f4 U- R7 E5 e3 h5 HLTE Design Verification Testing: V: r) e6 y8 h6 \|& i, a0 e7 H/ D" x8 F -! C- a0 @% _; r& X7 n; ^$ B Needed functionalities for R&D Testing # P7 L1 S- u/ \$ B7 j- A+ y+ {2 w; M C& M! F( _% e LTE Mobile Application Usage Cases 1 r I+ [+ h1 K1 P5 t, B& }-* W7 q+ {) ^8 m9 [; Y LTE RF Design Validation Tester	Rafael Garcia Escobar
16:00-16:20	Topic 4G-3	SAR Measurement of new technologies (e.g., Wi-MAX, LTE) and new devices (e.g., RFID, MIMO systems)	Prof. Niels Kuster
16:20-16:40	Topic HAC-1	Hearing Aid Compatibility (HAC): ANSI C63.19 & Reliable Hearing Aid Compatibility (HAC) assessment	Dr. Fin Bomholt
16:40-17:10	Topic EMI/ESD-1	Next generation of near-field probes and their applications in ESD, EMI, etc.	Prof. Niels Kuster
17:10-17:30	Q & A		Annie Yang
17: 30-17:40	Closing		Daniel Chang

※ 主辦單位保有更換講師及議題之權利

歡迎光臨 Chip123 科技應用創新平台 (http://free.vireal.world/chip123_website/innoingbbs/)