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標題: CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管? [打印本頁]

作者: scy8080    時間: 2012-2-3 02:59 PM
標題: CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管?
CMOS工艺下bandgap 负温度系数器件,为什么使用PNP管而不是用二极管?
作者: hoodlum    時間: 2012-2-3 10:59 PM
小弟的看法是% C, v; |4 P5 r( b  C
會不會是標準CMOS的製程裡! E% f8 a. E( J6 j; Q
無法做出二極體, 只能用寄生的
0 H- N4 ?( R$ ~2 D$ f: ?: Qvertical PNP呢???
作者: leo911759    時間: 2012-2-8 04:02 PM
其實也是有的。: V' x  o$ d- |. U& ^
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有一些Paper就是用Diode,或是NPN。% U; c9 p- ~, |2 S$ R% B
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而會用PNP 是因為早期CMOS製程中,只能寄生等效PNP電路。
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其中的寄生等效Diode會有Latch-up的問題。
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這是製程受限的關係,比較先進的製程就沒這種問題了。
作者: patrick02046    時間: 2012-2-9 01:24 PM
在EDA Board 抓的資訊, 參考一下:7 r$ v! Z* t1 V+ m
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I believe that what you are getting at is that there is a specific structure of P+/Nwell/Psub that is used for / I, V# {5 s) C* O2 X+ y5 `

7 f! B6 j) L- ?8 _the "bipolar", so you are asking why use that structure rather than simply a P+/Nwell "diode". Here is my take ; H3 }$ L8 k) R  m7 O
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on this:
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* l/ J4 Z. c6 t1- The "bipolar" will simulate more accurately than the "diode", since it will include the substrate current 9 e7 h9 v- t4 E% N+ U* q* a7 l+ K
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that is probably not modeled for the "diode".: K5 l9 [) X2 x, _! I0 C
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2- There usually is a specific structure for the "bipolar" that has characterization data available. When
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building a bandgap structure, the good characterization is needed in order to properly determine the tempco of 1 r7 `. s6 g6 N. \
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the Base-emitter voltage.# W+ E- A2 a. n7 b9 J) n* I) h

; O* ~$ [4 A. T( Q2 W1 T) l$ i3- The additional structure of the bipolar should help prevent current injection into other substrate tied
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' z" H$ o) R, x! P# I( W) ?devices.
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1 k; y# R, K( _There is, of course, nothing preventing the use of a P+/Nwell diode in your application.
作者: luckyhuihui666    時間: 2012-4-13 08:06 PM
主要原因就是二极管不准确……




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