Chip123 科技應用創新平台

標題: 2/16 行動通訊NFC與LTE測試研討會 [打印本頁]
作者: mister_liu    時間: 2012-2-7 10:37 AM
標題: 2/16 行動通訊NFC與LTE測試研討會
一、主辦單位：安達富通信股份有限公司(AT4 wireless Inc.)
' W. [+ ~- A3 ]2 ]二、活動時間： 101年  2月16日（星期四）9 P; V3 Y% b$ D* ~2 c- r" I
09:00~12:00  NFC於行動通訊之發展及應用
  K: n5 g. f2 n! A4 n$ }% b  I$ C13:00~17:00  LTE全球化的成功關鍵
2 k5 s. Q1 q! S) n: _三、活動地點：台灣區電機電子工業同業公會 第二會議室（台北市民權東路6段109號7樓）0 J( t: W8 l" L5 H
四、參加費用：免費。（座位有限，敬請提早報名）
$ f7 P2 V4 i6 z: ]五、活動內容：
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To be competitive in today’s wireless global environment it is essential not only to provide compliant terminals (according to the applicable international requirements) but also to demonstrate that devices perform efficiently when used under demanding conditions of capacity and speed.
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Besides, it is important for manufacturers to understand which are the technical requirements included in the test plans designed by network operators and having access to test tools that facilitate the simulation of those environments. LTE and NFC are key technologies for network operators and that is the reason why they are very important in the process of device selection and acceptance.. t5 d5 a% m7 Q  W

3 x& H6 C& t# _2 FThis seminar organized by AT4 wireless will cover very important topics related to LTE and NFC from different perspectives and points of views including regulatory aspects, design, performance and requirements from key network operators. All of them are key elements to be considered by manufacturers, solution vendors and operators involved in global business.
作者: mister_liu    時間: 2012-2-7 10:38 AM

時　　間

主　　　題

講　　　師

Morning Session: The importance of NFC in mobile

08:30~09:00

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報　 　 到

09:00~09:15

Welcome and Introduction

TBC

09:15~10:00

NFC Testing and Certification Introduction:

AT4 wireless

10:00~10:45

NFC Conformance and R&D testing

AT4 wireless

10:45~11:15

Coffee break

11:15~12:00

NFC Mobile Payments

Collis

Afternoon Session: Key to succeed in LTE globally

13:00~13:15

Welcome and Introduction

TBC

13:15~14:15

LTE R&D Testing

AT4 wireless

14:15~15:15

LTE Performance Testing

Spirent/GCOM

15:15~15:45

Coffee break

15:45~16:45

Device Acceptance for Network Operators

AT4 wireless

16:45~17:00

Seminar closure

作者: atitizz    時間: 2012-2-22 09:33 AM
標題: LTE經濟型的RSE測式方案
【台北訊】羅德史瓦茲推（R&S）出LTE混附波輻射干擾測試（RSE）的經濟方案，可在載波存在的情形下，輕鬆地對LTE產品進行輻射干擾測試。此方案乃利用R&S OSP，開放式切換控制平台，搭配OSP- B155　硬體配備，來進行量測。其價格還低於傳統利用頻帶阻截濾波器（Notch Filter）方式的費用。1 o' |) `  v! [1 s! E5 c) _
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無線設備製造商必須測量其產品的「混附波輻射干擾」（RSE, radiated spurious emissions），以確保他們產品不會干擾其他無線通訊的裝置。傳統之輻射干擾測試方法乃以濾波器抑制高強度的無線通訊信號載波。但LTE標準有258種頻寬的組合，使用這種方法會付出相當高的人力和成本。羅德史瓦茲公司推出一個非常簡單的解決方案- R&S OSP-B155，亦可協助客戶將預算控制在可接受範圍內。8 Q$ o0 X- f$ k
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其插件模組可將整個接收到的信號頻譜調整至最佳功率範圍內，以使用EMI測試接收機的最大動態範圍來進行量測。此接收機不需要頻帶阻截濾波器就可對整個LTE信號頻譜進行分析。成功地以此嶄新技術進行測量之前提，在於測試接收機之高接收靈敏度．只有高性能的EMI測試接收機足以檢測出所有相關的干擾輻射。此外，測試接收機亦必須具有高動態範圍之特性，以避免載波信號的峰值功率影響量測結果。R&S EMI測試接收機ESU的高靈敏度，可達到-155 dBm / Hz，結合80dB的動態範圍，為輻射干擾測量的理想選擇。



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