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標題: High-Speed Serial Data Test Major Challenge？ [打印本頁]

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作者: jiming    時間: 2008-9-22 06:07 PM
標題: High-Speed Serial Data Test Major Challenge？
Interfaces have moved from parallel to high-speed serial implementations!
- B3 O% y( u+ x/ g) G+ p* oImplications for Test & Measurement?

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