標題: ESD的另一种情况:CDE(Cable Discharge Event) [打印本頁] 作者: semico_ljj 時間: 2008-11-6 08:39 PM 標題: ESD的另一种情况:CDE(Cable Discharge Event) ESD的另一种情况:CDE ) M( d& ?7 z/ [CDE--Cable Discharge Event / I8 {* {" m8 m8 X : Q5 B1 p1 }4 Z% A+ VInvestigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology 7 B( C) D8 b( S+ }: \ 6 w7 |0 h6 N \! F; X& T* p作者: semico_ljj 時間: 2008-11-6 08:40 PM
Abstract—Cable discharge events (CDEs) have been found 1 ^6 _6 b0 @/ `: @ to be the major root cause of inducing hardware damage on 8 ^' L7 N4 J/ b' c Ethernet ICs of communication interfaces in real applications. Still,- O7 i7 b" n/ V! o. D8 {4 N' d
there is no device-level evaluation method to investigate the ro 5 Z0 Z3 J# b/ s, @6 b' z0 v bustness of complementary metal–oxide–semiconductor (CMOS) 8 E( o: E) D1 {* H9 L0 _! B2 P, r5 q devices against a CDE for a layout optimization in silicon chips.作者: semico_ljj 時間: 2008-11-6 08:41 PM
谢谢支持!作者: hansonzhao 時間: 2008-12-3 04:49 PM
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