Perhaps there're more problems which need more designers to discuss: - x- A2 d T( m- y
8 _% t& J+ R, K7 b1 @' E • Some of the tests are simply not performed8 B; u! e+ g; v; [' T, c, B* A
• Errors creep in MOST of the time; n' |' I( n5 y1 h4 I$ F+ V2 c
• Very hard to re-use analog testbenches+ t+ Y7 P- J2 m# Z2 O! |! T+ {9 P
• Language foundation and richness lacking
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發表於 2008-2-21 18:58:51
- x- A2 d T( m- y
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發表於 2008-7-13 14:38:46