Chip123 科技應用創新平台

 找回密碼
 申請會員

QQ登錄

只需一步,快速開始

Login

用FB帳號登入

搜索
1 2 3 4
查看: 4609|回復: 1
打印 上一主題 下一主題

[問題求助] NFC HW test是否有conductive test?

[複製鏈接]
跳轉到指定樓層
1#
發表於 2011-5-9 22:04:21 | 只看該作者 回帖獎勵 |倒序瀏覽 |閱讀模式
NFC HW test是否有conductive test to assure HW performance?
. H8 W  Q2 s# M8 S7 bAny test instrument to introduce?) L1 l. r% \$ p
Thanks
分享到:  QQ好友和群QQ好友和群 QQ空間QQ空間 騰訊微博騰訊微博 騰訊朋友騰訊朋友
收藏收藏 分享分享 頂 踩 分享分享
2#
發表於 2011-8-29 21:18:57 | 只看該作者
COMPRION is the only test equipment provider offering GCF and PTCRB validated SWP/HCI conformance test cases
/ U, i0 a" Q( f; XPaderborn, April 2011
) q! G3 e0 D% z" A) Q* E7 pCOMPRION's SWP and HCI test cases running on the conformance test system ‘UT³ Platform' are now validated by GCF. Thus, the UT³ Platform is the only system available offering SWP/HCI terminal tests validated by GCF and PTCRB. 5 K6 T! g. }( E6 @5 ^
4 ?4 a) f% g0 ]$ u% M9 t+ n  g
) t5 f9 K/ W$ [; I% B
! o" |- `& b) E* n# _
GCF has issued a Work Item (WI-133) to verify SWP and HCI functionality in mobile handsets. The process of introducing SWP/HCI tests into the GCF certification scheme has been finalised making the test cases available for validation. WI-133 covers test cases specified by ETSI TC SCP WG TEST in TS 102 694-1 (SWP) and TS 102 695-1 (HCI).
! u: {5 U; `4 M. l4 @
2 n: J+ J& e( Z4 o# p2 y7 O * v6 e# d4 c; n* Q+ g2 M
4 d2 e9 H' U5 m- b
With the validation of the first SWP/HCI test cases by GCF and PTCRB the building blocks for secure NFC applications such as payment have been laid. "We would like to contribute our part to ensuring interoperable NFC services." says Andreas Bertling, Chairman of ETSI TC SCP WG TEST and Product Manager at COMPRION.
您需要登錄後才可以回帖 登錄 | 申請會員

本版積分規則

首頁|手機版|Chip123 科技應用創新平台 |新契機國際商機整合股份有限公司

GMT+8, 2024-11-16 06:41 AM , Processed in 0.144009 second(s), 17 queries .

Powered by Discuz! X3.2

© 2001-2013 Comsenz Inc.

快速回復 返回頂部 返回列表