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測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個?8 n/ A& I/ i! ?8 m: |# z
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”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。: J/ `3 W6 W) D5 ~3 T0 H
R- X! m# o5 c2 d. Q( STest & Measurement World, 12/1/2006
i, Y0 D# B, m/ a3 L0 s: m6 k' R9 lhttp://www.reed-electronics.com/tmworld/article/CA6401689.html5 {+ x5 S- s, O. z: @ i! x7 f
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2007 Best in Test Award Winners . _: O/ z8 ^% M% R+ C3 b; m
DIGITAL MULTIMETERS3 u& q6 i, R& W, x, |7 w \
8846A digital multimeter, Fluke
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AUDIO TEST
' j+ ^: O( g/ b" wAPx585 audio tester, Audio Precision2 r: ~; J$ f- N: n( Z8 M4 ]$ k1 L
/ p, I9 ~- z4 R2 f6 \) m: x$ e$ aWAVEFORM GENERATORS; b" `; f3 w" t. O; ?0 O/ p
AWG7000 series arbitrary waveform generators, Tektronix0 D: _3 k2 [ K+ w2 \5 Q0 z# Q
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DATA-ACQUISITION. |* n3 s0 z/ t/ N& d% N) I# z3 u
CompactDaq USB-based data-acquisition system, National Instruments
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RF/MICROWAVE TEST: q H; @- [; |2 _7 Q7 R- ?0 W
FSUP signal source analyzer, Rohde & Schwarz) F, w. S! Z: h6 W+ [. E
. }9 t0 w8 d. H! z! ?$ P" aOSCILLOSCOPES8 H; H. _0 ^* \! X, V" p- ~
Infiniium 80000B series oscilloscopes, Agilent Technologies! A/ \4 t% g2 m8 j' l# |! k
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MEMS TEST
) b& O4 x; h2 C8 |. S0 fInFlip MEMS strip-test module, Multitest3 t* F; m3 i3 a. T
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PROBING SYSTEMS9 P) S- `* C0 D, Q
M150 Measurement Platform, Cascade Microtech
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AUTOMATED OPTICAL INSPECTION+ M. M- e& I6 m$ m7 R
OptiCon BasicLine 1M/4M AOI system, Goepel electronic9 `4 C' q0 y. |5 E: ?! k: a
3 H& l2 I" r& S. d3 |- `8 [/ dWIRELINE COMMUNICATIONS
$ Y' p; P7 `: v5 HSpirent Protocol Tester, Spirent Communications
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BOARD TEST
. c" D D" D# _* ~$ Q# F u# y) J, zTapCommunicator boundary-scan interface, JTAG Technologies8 d# M. |1 @8 X1 n( D5 w
9 N: Z2 @/ b7 U W3 ^SEMICONDUCTOR TEST
; M( B v9 P7 N# W6 gTest Management Solutions software, OptimalTest
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2007 Best in Test Awards—Honorable Mentions+ z( @% j& I" Q. }3 _
WaveRunner 204Xi oscilloscope) }6 f! ], N( ?* i$ H8 K
LeCroy, www.lecroy.com9 N0 u. D, E6 P; g4 E
( p* R$ g! f7 {% C) z5 `SystemBIST FPGA configuration device" r8 B0 K' g7 Y5 R6 f: G
Intellitech, www.intellitech.com- Z9 x0 ]( ^' e/ h" Y
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Vanguard Express AMC protocol & link analyzer
# I/ S! K! \! C9 |5 f' ?* ^Vmetro, www.vmetro.com
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BBWGD 16-channel mixed-signal module for SoC test
3 v8 |' R9 [/ hAdvantest, www.advantest.com
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) l% g( a1 G3 _- }% Y& RN9020A MXA signal analyzer; s. Z5 k; Z" N2 h6 Q1 g
Agilent Technologies, www.agilent.com. Y6 I5 E% R2 w. w
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Signature MS2781B signal analyzer8 o5 H. \' ~1 c. Y' T
Anritsu, www.us.anritsu.com
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) d3 {( N# ~& o% hDPO4000 oscilloscopes with Wave Inspector
9 K. f; V8 n" e0 a0 ^+ l" w2 gTektronix, www.tektronix.com
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7 h; u5 ~4 e. j2 w% i# @3 ]$ @) oMedalist iVTEP vectorless test software0 K, M G0 W/ A1 X
Agilent Technologies, www.agilent.com
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8 W" G+ Q ~! G9 {( yV93000 HSM high-speed DRAM tester
3 ~- h3 r) S( t# {' G+ T$ UVerigy, www.verigy.com0 d+ \$ N& V% K) S
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Siloti SilVE visibility enhancement tool
2 S/ L! q8 h B0 ]9 Z" xNovas Software, www.novas.com
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. M% S& y3 I% m, s0 o s; ?" h* M5 NE2960B Series protocol analyzer/exerciser for PCIe27 r" p$ F. K3 ^# A
Agilent Technologies, www.agilent.com 3 R" j' P5 F* p, d
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R&S ESU EMI test receivers
% ^! |2 a4 \6 G1 ARohde & Schwarz, www.rohde-schwarz.com. b9 v% f6 A8 N: |
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Model 2910/2810 vector signal generator/analyzer# S$ W# }. k; ^& ]
Keithley Instruments, www.keithley.com |
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