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測試工程師,你覺得這份量測榜單如何?如果讓你選明年最想玩的3套量測設備,你會選哪幾個? G* Y. ?5 X0 p6 ^
1 ^$ ^0 y6 G h0 e: u”Best in Test”獎項為每年頒發一次,主要是針對特別創新或設計以使用者為導項的產品進行評選。其總共設定12個不同的產品應用領域,無論是產品的製造廠商或是使用者,都可以分別就各領域項目,針對上一年度廠商所發表的產品提名。挾著65,000份的發行量,Test & Measurement World在T&M貿易期刊中占有十足的影響力,目前擁有 130,000 讀者,55 % 為管理階級。; b+ e# x9 a; x
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Test & Measurement World, 12/1/20069 h, R1 b8 F4 F3 q2 a: Z9 }
http://www.reed-electronics.com/tmworld/article/CA6401689.html
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8 p+ i( D* l4 _/ e" [2007 Best in Test Award Winners
9 K7 l# X+ h& X0 m2 L) A4 oDIGITAL MULTIMETERS
* w t W" e' c; D8846A digital multimeter, Fluke9 K. d/ N0 G, X# I* F* ^# G
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AUDIO TEST% H6 f6 [% V) f9 W3 {
APx585 audio tester, Audio Precision
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& z1 B8 i+ {) w% QWAVEFORM GENERATORS
2 L: c- R$ h! S0 g+ M4 Q7 pAWG7000 series arbitrary waveform generators, Tektronix; Z. c7 l, Z9 Z2 w8 u5 t1 R4 G" P
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DATA-ACQUISITION
* d. Q, W! h) M& L0 M0 L0 O( sCompactDaq USB-based data-acquisition system, National Instruments: R. M! P" a/ h6 e% p
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RF/MICROWAVE TEST
# x" @) |) y6 H. hFSUP signal source analyzer, Rohde & Schwarz; E4 h1 v: R4 L$ p8 Q/ U
$ N" G. s2 G; k4 pOSCILLOSCOPES8 ^: W- B% b7 v, G. H" f2 B
Infiniium 80000B series oscilloscopes, Agilent Technologies, S6 P. a1 v; d' j" ~. }
* }& z* J' T! M' a6 wMEMS TEST
* ~9 [# R# Z8 P; @. AInFlip MEMS strip-test module, Multitest0 H' N, {* c9 o
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PROBING SYSTEMS0 w$ B0 Y( W) b- Z0 X7 D( n i
M150 Measurement Platform, Cascade Microtech, O z/ s0 ?0 c) t& ^; t1 l
& }) W. H; c5 _AUTOMATED OPTICAL INSPECTION
( f! Y6 A/ h' ?9 w% YOptiCon BasicLine 1M/4M AOI system, Goepel electronic
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WIRELINE COMMUNICATIONS
3 C* u; F; d; w$ H8 NSpirent Protocol Tester, Spirent Communications) V9 k% x0 W) _, a6 O
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BOARD TEST
( J+ d' {8 \, Z. N0 gTapCommunicator boundary-scan interface, JTAG Technologies. S0 ~1 o/ ^- t U. ]5 ^4 D( m" C
- Q6 z. n1 S9 A- F* f0 iSEMICONDUCTOR TEST) A0 k6 p$ i" {1 W# N# \( }
Test Management Solutions software, OptimalTest! @/ o, d F% d
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2007 Best in Test Awards—Honorable Mentions, ^9 W: p9 w0 {1 j) n
WaveRunner 204Xi oscilloscope
- C8 D, o4 O. W+ [9 F3 ILeCroy, www.lecroy.com" G' t1 s' b/ ]4 t5 {9 A- P+ D. r
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SystemBIST FPGA configuration device
1 h9 c) V4 `9 |- C0 V. v9 PIntellitech, www.intellitech.com
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* c' ]+ ?& z8 n8 B/ bVanguard Express AMC protocol & link analyzer+ U% H- u) b% t I% D
Vmetro, www.vmetro.com
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BBWGD 16-channel mixed-signal module for SoC test/ S3 b8 h8 B1 F" O
Advantest, www.advantest.com
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) [# d- c; ~2 I6 W4 Q. H6 K2 zN9020A MXA signal analyzer' c6 Y' c8 G6 @ t6 B1 m
Agilent Technologies, www.agilent.com
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$ ~* u8 m% y; D7 kSignature MS2781B signal analyzer
& f2 q. Z& S5 l! t) J' OAnritsu, www.us.anritsu.com
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DPO4000 oscilloscopes with Wave Inspector
+ S8 u+ B5 [ z2 C% x& {Tektronix, www.tektronix.com6 O+ o5 |9 f* Z; A6 `7 B
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Medalist iVTEP vectorless test software
3 g' o" R; p9 m7 e9 NAgilent Technologies, www.agilent.com
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7 Y9 Y1 e& C8 v3 K# z% UV93000 HSM high-speed DRAM tester, C! y9 ]& y% B3 \+ Q
Verigy, www.verigy.com
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Siloti SilVE visibility enhancement tool/ Q& L0 e3 Q& ^8 _0 U5 ^" h- k
Novas Software, www.novas.com8 w' N- _) w: x7 h
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E2960B Series protocol analyzer/exerciser for PCIe2
8 W' d1 q Q+ WAgilent Technologies, www.agilent.com 5 \; t1 [. Q( a2 ?9 x
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R&S ESU EMI test receivers4 K, Q" e: z h e( |
Rohde & Schwarz, www.rohde-schwarz.com# L- }* ^6 k+ G2 n3 l5 J! V' j
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Model 2910/2810 vector signal generator/analyzer7 A4 g3 g! f4 ?0 ~: q& h6 U0 p
Keithley Instruments, www.keithley.com |
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