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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents
# D. W% D- t$ m; p: GProbes – The Critical Link To Measurement Quality . . . . . . . . .5
m* C, l) P3 O2 F7 SWhat is a Probe? . . . . . .5
9 v& q5 s7 u* K, _# gThe Ideal Probe . . . . . . .6: [0 A# X) X0 E* H6 ^
The Realities of Probes . 7
$ g& I* L* F6 [: ?/ {+ G8 Z. e/ dChoosing the Right Probe .10- y. ^; R: E/ E- j+ `
Some Probing Tips . . . .11
) A/ Z8 O8 F4 \3 a, V' D# C9 _Summary 12
% a* w6 y% ? PDifferent Probes for Different Needs . . . . . . . . .13
# ]/ O, l4 w* l( w0 L- Q3 jWhy So Many Probes? .131 I( W& D$ P9 _
Different Probe Types and Their Benefits . . . . . . . .14, Q( } n# u0 _. ]. `( z+ [6 M2 z2 D
Floating Measurements .19% r6 Q% @4 x2 M8 d$ ^0 v( b
Probe Accessories . . . .20" n: r( Z5 _7 ?4 n% A! X( V
How Probes Affect Your Measurements . . . . . . 22+ n+ a& ], d6 _& \2 x- ` A1 ]
The Effect of Source Impedance . . . . .22
% S- q6 w* K z9 ?Capacitive Loading . . . .22
8 z7 B5 D) f% s6 I2 \6 ?# TBandwidth Considerations 24
1 N [1 f. A$ D' E$ ]What To Do About Probing Effects . . . .28
) B) e: x) n5 i) `% _8 h. TUnderstanding Probe Specifications . . . . . . . .29
3 W, C6 l7 g% q5 }8 W' N8 z2 qAberrations (universal) . 29* n* o4 k! R/ Z5 C: }
Amp-Second Product (current probes) .29
: E; [; c% _2 s' S2 `Attenuation Factor (universal) . . . . . . .29
r# X. n* J7 J% O( zAccuracy (universal) . . .299 i: W' s( k, g! t
Bandwidth (universal) . .30
7 O, U5 ~% }" B1 zCapacitance (universal) .30( U4 S7 H: f. v: W" j4 L
CMRR (differential probes) . . . . . . . . .30" Y1 ~! v d9 N
CW Frequency Current Derating (current probes) . . .31. M2 H/ L6 G1 i1 V& G$ ?3 y
Decay Time Constant (current probes) .31- `* _! h1 e& x8 s+ ]2 E2 [
Direct Current (current probes) . . . . . .31
& i8 y9 x, F+ c& E ^$ dInsertion Impedance (current probes) . .31+ p: |0 q2 ^/ }! h/ U: d$ \
Input Capacitance (universal) . . . . . . . .31* R* e3 i9 I4 e; V) B
Input Resistance (universal) . . . . . . . . .313 Z' S4 s: F: q2 b! P! b# T
Maximum Input Current Rating (current probes) . . .31
+ {+ l' Q. A K9 |, KMaximum Peak Pulse Current Rating (current probes) .31
, k* u0 N- w+ {: P& kMaximum Voltage Rating (universal) . . .31
. v' p1 h1 j/ g$ cPropagation Delay (universal) . . . . . . .31
7 F+ ?/ P) Y. U, f+ d" URise Time (universal) . .31
" V8 u0 r+ R: J9 t1 J) g3 OTangential Noise (active probes) . . . . .31
7 w- F9 F1 u3 L' R/ h- ETemperature Range (universal) . . . . . .31
+ Z/ Y8 T' B J+ TA Guide to Probe Selection . . . . . . .32
( [" L& ?; l; f+ eUnderstanding the Signal Source . . . . .324 I8 h( x9 u P/ X7 M/ J
Oscilloscope Issues . . .340 K+ a: f) w3 w+ R1 y; n6 p6 T1 R
Selecting the Right Probe 35
3 y7 o# c# u; Q) U5 l: F) WAdvanced Probing Techniques . . . .36/ j) D' M/ t; M# L# ?% P
Ground Lead Issues . . .36
% v+ M9 y2 e: R% cDifferential Measurements . . . . . . . . .39
# r# U/ F5 }/ z; gSmall Signal Measurements . . . . . . . . 428 ]9 T8 N# s6 O+ @! t( n
Explanation of Safety Precautions .44
# | B5 i Y; ~; {) x* vObserve All Terminal Ratings . . . . . . . 44
. W4 Y" v9 F6 q/ F$ CUse Proper Grounding Procedures . . . .44- I* \/ ^7 c, ^
Connect and Disconnect Probes Properly . . . . . . . .44
% ^2 b: i1 d: X. j. K, n) \" v7 IAvoid Exposed Circuitry . .45% v8 Q: D8 f: a$ k9 \
Avoid RF Burns While Handling Probes .45 p% {, M' e8 O2 Y0 z& Y2 ~0 c" Q" U
Do Not Operate Without Covers . . . . . .45
& t8 d1 ?/ n5 U# _4 ~9 G0 u! UDo Not Operate in Wet/Damp Conditions . . . . . . . .45
. \+ _: G6 y GDo Not Operate in an Explosive Atmosphere . . . . . .45$ B% Q9 } p% c, M
Do Not Operate with Suspected Failures . . . . . . . . .45
9 d% X& D+ T$ JKeep Probe Surfaces Clean and Dry . . .45! ^, Q- r: [. p6 C3 `- E2 ~" S( }
Do Not Immerse Probes in Liquids . . . .458 G/ {3 X2 d9 {# S% J9 x0 L
Glossary5 J6 |) i P$ j( {6 H0 c: y
3 _8 E, V4 }. r8 _& h
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