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發表於 2008-9-12 11:18:59
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ABCs of Probes
Table of Contents# g& c0 h& j6 V6 E8 F. I
Probes – The Critical Link To Measurement Quality . . . . . . . . .5
6 U4 v2 M7 m/ F" I$ I ?- L0 qWhat is a Probe? . . . . . .5' i- k" A0 _ y8 V/ b* u- @3 m
The Ideal Probe . . . . . . .6
+ z8 i7 m7 @/ r- P0 e( z( xThe Realities of Probes . 73 M4 o6 y9 m2 J9 O
Choosing the Right Probe .10) {4 G: l# D+ D8 }
Some Probing Tips . . . .11
; z; D) i9 u8 i1 I- C; hSummary 125 z: T; Q& v+ E1 ]4 }
Different Probes for Different Needs . . . . . . . . .133 a3 X- d) {5 h
Why So Many Probes? .13 F8 p# A; K* g" U _* B
Different Probe Types and Their Benefits . . . . . . . .14
8 Y, u/ @+ i/ RFloating Measurements .19
) L6 E4 V0 J$ G: iProbe Accessories . . . .20' m$ I- k2 Q8 E$ {5 b
How Probes Affect Your Measurements . . . . . . 22) j- [5 W/ C# E" z
The Effect of Source Impedance . . . . .222 q$ \; E3 t7 w( [0 T
Capacitive Loading . . . .229 B" W$ q( b2 }, Y4 s9 S
Bandwidth Considerations 24! s c, r9 e& K
What To Do About Probing Effects . . . .28( R* N, t: m5 q! D0 K
Understanding Probe Specifications . . . . . . . .29
/ }# I/ F. [& O7 mAberrations (universal) . 29
! j( T% X6 S. \0 V" D" ~- v8 r; mAmp-Second Product (current probes) .29 c7 I- v; i) |9 q8 |6 \$ I/ l# z
Attenuation Factor (universal) . . . . . . .29
$ e4 h6 C3 D0 `; E5 Y" y% e& q/ nAccuracy (universal) . . .291 @& q \" W; ]7 k" u4 _
Bandwidth (universal) . .30! q4 ~% F7 L0 u3 Z. M9 P
Capacitance (universal) .30
' e3 Y5 t+ f# V1 nCMRR (differential probes) . . . . . . . . .30
1 i3 |! B' f$ n7 jCW Frequency Current Derating (current probes) . . .31
0 n" g2 V( t/ w2 j! D. @6 p0 i* ]$ Y6 H+ hDecay Time Constant (current probes) .31& G! F6 e7 `7 K# [- ^! @ P) I
Direct Current (current probes) . . . . . .313 ^2 g; S/ z2 \, q
Insertion Impedance (current probes) . .31$ |0 h/ V! @# D& y7 U
Input Capacitance (universal) . . . . . . . .313 } S2 `% v2 ]( N8 ~, z- l
Input Resistance (universal) . . . . . . . . .31- N I0 r$ T) _" K; Y+ @
Maximum Input Current Rating (current probes) . . .31
. m5 p, N# m3 O. n' O3 DMaximum Peak Pulse Current Rating (current probes) .31; z% ]9 h' w' U
Maximum Voltage Rating (universal) . . .31- i. q& z8 f+ }# y- \8 d4 L
Propagation Delay (universal) . . . . . . .31
! W: }$ o3 I9 ]( D6 k$ k$ N4 Z. yRise Time (universal) . .31
5 |+ N. E/ `" XTangential Noise (active probes) . . . . .31
2 s/ I; y+ a. lTemperature Range (universal) . . . . . .31
/ T: k- l% f |7 s: s% tA Guide to Probe Selection . . . . . . .320 K8 U6 x0 ]7 r7 F+ r5 d1 ?
Understanding the Signal Source . . . . .32
6 E% U4 _. E( qOscilloscope Issues . . .34
( R* J8 ^7 G1 f g: zSelecting the Right Probe 354 w% \! v$ G3 w/ c! ?7 m
Advanced Probing Techniques . . . .36
5 a5 m- K% I! y5 Z# j/ ^Ground Lead Issues . . .366 @: w d, D; \- D- k6 X3 V5 c
Differential Measurements . . . . . . . . .39
0 L$ R) Y n; e, \7 X3 N wSmall Signal Measurements . . . . . . . . 42. `* X5 }* W1 }7 A
Explanation of Safety Precautions .44+ P4 \1 P. I3 X7 x! Y: E& s
Observe All Terminal Ratings . . . . . . . 44
6 L* t% @0 A& j2 xUse Proper Grounding Procedures . . . .44
( B- F3 O# _ j0 U- W0 t( b, _Connect and Disconnect Probes Properly . . . . . . . .44' R P: a2 r5 q, M; z, O; a
Avoid Exposed Circuitry . .453 U M1 S! t( V" k8 i0 m+ [+ ^
Avoid RF Burns While Handling Probes .45# b* `% K8 L/ {9 R. H
Do Not Operate Without Covers . . . . . .45
% S- j6 W) F5 q6 ^Do Not Operate in Wet/Damp Conditions . . . . . . . .45
" y. d0 W3 u y; c" ~Do Not Operate in an Explosive Atmosphere . . . . . .45+ @( B& C9 }- [3 q3 D- ?: @
Do Not Operate with Suspected Failures . . . . . . . . .45
, v2 {( |6 {6 D W1 Y( \7 {5 [Keep Probe Surfaces Clean and Dry . . .456 t6 D3 C- L" m
Do Not Immerse Probes in Liquids . . . .45; Z- m3 f6 A. d8 b
Glossary
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