IEEE Std 1149.1-2001 Test Access Port and Boundary-Scan Architecture

michaldl

Sponsor
Test Technology Standards Committee of the IEEE Computer Society
/ R" b: p+ V7 @" o- r$ m0 z5 D4 ^Approved 14 June 2001
IEEE-SA Standards Board
1 Y# j5 x" I" D9 U8 VAbstract: Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and
support of assembled printed circuit boards is defined. The circuitry includes a standard interface
through which instructions and test data are communicated. A set of test features is defined,
8 W1 p& o, \! z- Lincluding a boundary-scan register, such that the component is able to respond to a minimum set
/ o) J. z% ^' `( wof instructions designed to assist with testing of assembled printed circuit boards. Also, a language
" d6 T$ M/ o! T1 @- [- E! T2 `8 Zis defined that allows rigorous description of the component-specific aspects of such testability features.

Keywords: boundary scan, boundary-scan architecture, Boundary-Scan Description Language,
- I- l5 M! M7 @8 P6 eboundary-scan register, BSDL, circuit boards, circuitry, integrated circuit, printed circuit boards,
+ n& ~! `& K+ I1 r; P0 QTAP, test, test access port, VHDL, VHSIC Hardware Description Language
& ~  \2 {& ~4 |  s5 j. ~9 j

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