DFTC + ATPG Flow 中 scan_en & test_mode 問題

hgby2209

請問 Scan_en 可與其他 function pin , share pin 腳嗎?
Test_mode 我查到是可以 share pin 但scan_en 沒查到可以,
: ^, H) n6 X  z0 L8 M所以不知可否?

rogeryang

scan_en 不行與其他 function pin share pin 腳.

lee100

actually  scan enable signal can be shared with function pin, user have to insert control logic ("AND" gate for example, one of AND gate input connected to original function pin, another AND gate input connected to scan test mode signal and output of AND gate connected to scan enable pin of scan flip-flop). User should aware that fault coverage of cloud logic may dropped.